【英文标准名称】:StandardGuideforTransientRadiationUpsetThresholdTestingofDigitalIntegratedCircuits(Metric)
【原文标准名称】:数字集成电路瞬态辐射破坏阈试验标准指南(米制单位)
【标准号】:ASTMF1262M-1995(2008)
【标准状态】:现行
【国别】:美国
【发布日期】:1995
【实施或试行日期】:
【发布单位】:美国材料与试验协会(US-ASTM)
【起草单位】:F01.11
【标准类型】:(Guide)
【标准水平】:()
【中文主题词】:
【英文主题词】:digitalintegratedcircuits;digitalIC's;functionalerrors;ionizing;pulsedradiation;radiation;transientradiation;upsetthreshold;Combinationallogic;Destructivetesting--semiconductors;Digitalintegratedcircuits;Electricalconductors(
【摘要】:Digitallogiccircuitsareusedinsystemapplicationswheretheyareexposedtopulsesofradiation.Itisimportanttoknowtheminimumradiationlevelatwhichtransientfailurescanbeinduced,sincethisaffectssystemoperation.1.1Thisguideistoassistexperimentersinmeasuringthetransientradiationupsetthresholdofsilicondigitalintegratedcircuitsexposedtopulsesofionizingradiationgreaterthan103Gy(Si)/s.1.2Thisstandarddoesnotpurporttoaddressallofthesafetyconcerns,ifany,associatedwithitsuse.Itistheresponsibilityoftheuserofthisstandardtoestablishappropriatesafetyandhealthpracticesanddeterminetheapplicabilityofregulatorylimitationspriortouse.
【中国标准分类号】:L56
【国际标准分类号】:
【页数】:5P.;A4
【正文语种】:英语