【英文标准名称】:Semiconductordevices-Mechanicalandclimatictestmethods-General
【原文标准名称】:半导体器件.机械和气候试验方法.总则
【标准号】:BSEN60749-1-2003
【标准状态】:现行
【国别】:英国
【发布日期】:2003-07-07
【实施或试行日期】:2003-07-07
【发布单位】:英国标准学会(GB-BSI)
【起草单位】:BSI
【标准类型】:()
【标准水平】:()
【中文主题词】:元部件;外观检查(试验);环境试验;环境;气候;大气压;半导体;集成电路;尺寸;潮气;电学测量;气候试验;半导体器件;温度变化;试验;电子工程;温度;电气工程;电子设备及元件;机械试验;易燃性;耐力
【英文主题词】:Atmosphericpressure;Changesoftemperature;Climate;Climatictests;Components;Dimensions;Electricalengineering;Electricalmeasurement;Electronicengineering;Electronicequipmentandcomponents;Environment;Environmentalcondition;Environmentaltesting;Environmentaltests;Flammability;Integratedcircuits;Mechanicaltesting;Moisture;Properties;Resistance;Semiconductordevices;Semiconductors;Temperature;Testing;Visualinspection(testing)
【摘要】:ThispartofIEC60749isapplicabletosemiconductordevices(discretedevicesandintegratedcircuits)andestablishesprovisionscommontoalltheotherpartsoftheseries.Inthecaseofcontradictionbetweenthisstandardandarelevantprocurementspecification,thelattershouldgovern.
【中国标准分类号】:L40
【国际标准分类号】:31_080_01
【页数】:12P.;A4
【正文语种】:英语